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DTSTART:20180325T030000
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DTSTART:20171029T020000
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DTSTAMP:20260424T143255Z
UID:5a08c415a9ba8654111079@ist.ac.at
DTSTART:20171128T090000
DTEND:20171128T101500
DESCRIPTION:Speaker: Dan White\nhosted by Martin Loose\nAbstract: Structure
 d Illumination Microscopy (SIM) is a fast and live cell compatible method 
 to beat the performance of widefield and confocal microscopes in contrast\
 , resolution (120 nm) and even speed over a large field of view\, using th
 e samples you already have. The method is simple in principle\, but the de
 tails really matter: Accuracy\, Reproducibility\, Sensitivity\, High Speed
 \, Optics Alignment and Selection\, and of course the reconstruction algor
 ithm implementation must all be finely tuned (but not by the user!) Combin
 ation of total internal reflection microscopy and SIM (TIRF-SIM) allows ev
 en more resolution and speed\, and produces stunning results of objects mo
 ving close the coverslip at many frames per second. The OMX SR provides a 
 user friendly\, compact\, super-fast\, robust\, stable and finely tunable 
 fluorescence microscopy platform for 3D-SIM\, as well as widefield restora
 tion (deconvolution) microscopy\, and also TIRF and TIRF-SIM. The hardware
  and software design\, implementation\, and ease of use enable to user to 
 concentrate on the biology and getting world class microscopy results\, wh
 ilst the machine takes care of the details.This seminar will introduce you
  to 3D-SIM and TIRF-SIM\, as well as why image restoration (deconvolution)
  is a must using music as an analogy. Also\, the unique OMX hardware imple
 mentation\, system optimisation\, ease of use\, and tips and tricks will b
 e discussed.
LOCATION:Mondi Seminar Room 3\, Central Building\, ISTA
ORGANIZER:mloose@ist.ac.at
SUMMARY:Dan White: GE OMX SR: Making sense of (TIRF) SIM and demystifying d
 econvolution.
URL:https://talks-calendar.ista.ac.at/events/958
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