Atom probe tomography is a burgeoning microscopy and microanalysis technique allowing for compositional mapping of solid materials with sub-nanometre resolution and sensitivity in the range of tens of parts-per-million across all elements.
In this seminar, I will go back to the basics of the technique, and discuss its performance limits, and will introduce the latest developments of the technique involving the use of cryogenic specimen preparation and transfer to broaden the field of application to e.g. frozen liquid and liquid-solid interfaces. I will also showcase its application in energy materials research.
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Meeting ID: 615 2507 0226
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Meeting ID: 615 2507 0226
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