An introduction to atom probe tomography

Atom probe tomography is a burgeoning microscopy and microanalysis technique allowing for compositional mapping of solid materials with sub-nanometre resolution and sensitivity in the range of tens of parts-per-million across all elements. 

In this seminar, I will go back to the basics of the technique, and discuss its performance limits, and will introduce the latest developments of the technique involving the use of cryogenic specimen preparation and transfer to broaden the field of application to e.g. frozen liquid and liquid-solid interfaces. I will also showcase its application in energy materials research. 

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https://istaustria.zoom.us/j/61525070226?pwd=cWloMkpjRHBmM3B2eng3bTVSWjNhUT09

Meeting ID: 615 2507 0226
Passcode: 164727
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Meeting ID: 615 2507 0226
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